Abstract: The die-attach layer is a vulnerable structure that is important to the reliability of an insulated-gate bipolar transistor (IGBT) module. A new failure mechanism named fatigue crack network ...
bash_unit allows you to write unit tests (functions starting with test), run them and, in case of failure, displays the stack trace with source file and line number indications to locate the problem.
After testing modernized Leopard 1 with new C3105 turret for Ukraine, more such modules were ordered for vehicles, first 5 of which will arrive only in June 2027 Ukraine is already testing modernized ...
Abstract: One common theme of today's electric power systems is the increased use of fast switching power electronic inverters. In the power electronics field, experimental or ...
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