IEEE

Correlation Between CD/LWR and Focus Level Fitting Error: A Process Quality Indicator

Abstract: Achieving uniformity of patterns on photoresists is a significant challenge as process nodes get smaller. In practical production lines, the level sensor (LS) of the lithography system will ...
IEEE

Detection Approach of Malicious JavaScript Code Based on deep learning

Abstract: Traditional machine learning methods for detecting JavaScript malicious code have the problems of complex feature extraction process, extensive computation, and difficult detection due to ...
Hosted on MSN

‘What could have been a crisis now looks like a managed process’: Officials expect work on water main break to take 2 more weeks

SYRACUSE, N.Y. (WSYR-TV) — Amid a million-dollar project to fix the water main break forcing many Central New Yorkers to conserve water, officials said today that they expect the work to take at least ...
Bleeping Computer

Massive Rainbow Six Siege breach gives players billions of credits

Ubisoft's Rainbow Six Siege (R6) suffered a breach that allowed hackers to abuse internal systems to ban and unban players, manipulate in-game moderation feeds, and grant massive amounts of in-game ...