IEEE

Fatigue Crack Networks in Die-Attach Layers of IGBT Modules Under a Power Cycling Test

Abstract: The die-attach layer is a vulnerable structure that is important to the reliability of an insulated-gate bipolar transistor (IGBT) module. A new failure mechanism named fatigue crack network ...
GitHub

bash_unit - bash unit testing enterprise edition framework for professionals!

bash_unit allows you to write unit tests (functions starting with test), run them and, in case of failure, displays the stack trace with source file and line number indications to locate the problem.
IEEE

Multitarget Flexible Angular Emulation for the ISAC Base Station Sensing Test Using a Conductive Amplitude and Phase Matrix Setup: The Framework and Experimental Validation

Abstract: Comprehensive evaluation of the functionalities, algorithms, hardware components, and performance characteristics of future integrated sensing and communication (ISAC) base stations (BSs) ...
en.defence-ua

Ukraine Orders 30 More C3105 Turret Modules for Leopard 1 After Combat Testing, But First Five Won’t Arrive Until June 2027

After testing modernized Leopard 1 with new C3105 turret for Ukraine, more such modules were ordered for vehicles, first 5 of which will arrive only in June 2027 Ukraine is already testing modernized ...