The picture on a TV set used to be the combined product of multiple analog systems, and since TVs had no internal diagnostics, the only way to know things were adjusted properly was to see for ...
For over 15 years, I've been a big proponent of hierarchical test. Hierarchical test is the commonly used term for creating DFT (design-for-test) features and test patterns at lower level circuit ...
CRTs don’t last forever, and neither do the electronics that drive them. When you have a screen starting to go wonky, then you need a way to troubleshoot which is at fault. A great tool for that is a ...
Scan testing has been the foundation of digital-device production test for many years. Several innovations have been developed to keep up with the growth in pattern-set sizes brought about by large ...
Download this article in PDF format. Finding the right balance among test cost, test quality, and data collection for running diagnosis requires consideration of several competing factors. Luckily ...
Test compression sounds like magic. Read on to learn how this trick is done. Large, complex ICs are viable because their design meets test as well as functional requirements. Design for test (DFT) was ...
The Sarnoff Digital Test Pattern When I was approached about evaluating the Sarnoff Digital Test Pattern, my interest was piqued immediately. After all, it's been a long time since most of us have ...
This paper is presented with the Video Graphics Array (VGA) and Digital Visual Interface - Digital (DVI-D) test pattern generator solution with display monitor timing specification as per the Video ...
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