Duke engineers show how a common device architecture used to test 2D transistors overstates their performance prospects in real-world devices.

Lab architecture used to test 2D semiconductors artificially boosts performance metrics, making it harder to assess whether these materials can truly replace silicon.

A universal passive logic element of positive and negative logic, made on just one transistor, is proposed. The logic element has at least two inputs, as well as three outputs: an OR, an XOR, and an ...