Two test strategies are used to test virtually all IC logic—automatic test pattern generation (ATPG) with test pattern compression, and logic built-in self-test (BIST). For many years, there was a ...
When the new version of the artificial intelligence tool ChatGPT arrived this week, I watched it do something impressive: solve logic puzzles. One after the other, I fed the AI called GPT-4 questions ...
Small geometries have projected IC technology into an era where test has become a crucial part in the chip design process and have introduced new challenges needing solutions that use already ...
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