Tektronix has announced an analyser that characterises semiconductor devices and materials. Following on from the Keithley 4200-SCS, the 4200A-SCS has a new graphical user interface and helpful ...
BEAVERTON, Ore., Oct. 29, 2019 /PRNewswire/ -- Tektronix, Inc. today announced the availability of two new source measure unit (SMU) modules for the Keithley 4200A-SCS Parameter Analyzer that can ...
Beaverton, OR. Tektronix today introduced the customizable and fully integrated Keithley 4200A-SCS parameter analyzer, which accelerates semiconductor device, materials, and process insights by ...
A probe station is available for connecting to electrical devices with contact pads down to 50 µm × 50 µm. There are four micromanipulators for making contact to samples. The probe station is also ...
BEAVERTON, OR. Tektronix Inc. has announced the availability of two new source-measure unit (SMU) modules for the Keithley 4200A-SCS parameter analyzer that can perform low-current measurements even ...
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