REHOVOT, Israel, July 8, 2019 /PRNewswire/ -- Nova (Nasdaq: NVMI) announced today the launch of Nova PRIZM™, its newest standalone Optical CD system targeted at the most complex device manufacturing ...

Dimensional metrology using scanning probe microscopy (SPM) refers to the precise measurement of three‐dimensional features at the micro‐ and nanoscale by raster-scanning a sharp probe across a ...

Rigaku Opens "Rigaku Solutions Center Osaka" to Strengthen Global Semiconductor Metrology Service Capabilities- Centralizing and Expanding Practical Training to Strengthen Global Service Capabilities ...

Several chipmakers are making some major changes in the characterization/metrology lab, adding more fab-like processes in this group to help speed up chip development times. The ...

Linear motion components provide the foundation for smooth axis movement on a machine tool. Here are factors to consider when choosing machines with linear motion components that are durable and ...

The performance, reliability and longevity of machined parts often depend on the physical characteristics of their functional surfaces. However, legacy surface roughness parameters, such as R a, are ...

The fiber itself is used as a transducer in many fiber optic sensing systems (see the section titled “Fiber Sensors,” in ADVANCES IN OPTICAL METROLOGY, the section titled “Optical Fiber Sensors,” in ...

The Korea Research Institute of Standards and Science has successfully developed a length measurement system that achieves a level of precision approaching the theoretical limit allowed by quantum ...

Competition is heating up in the atomic force microscopy (AFM) market, where several vendors are shipping new AFM systems that address various metrology challenges in packaging, semiconductors and ...

This market expansion is influenced by increasing manufacturing complexity, the proliferation of automation, and smart facto ...