A study published in Molecules and led by researchers from the Changchun Institute of Optics, Fine Mechanics and Physics (CIOMP) of the Chinese Academy of Sciences demonstrated how deep learning can ...

A new study explores deep learning for image-based defect detection during 3D printing, looking to catch bad builds.

Researchers have tested eight stand-alone deep learning methods for PV cell fault detection and have found that their accuracy was as high as 73%. All methods were trained and tested on the ELPV ...

This paper discusses a deep learning approach for detecting defects in photovoltaic (PV) modules using electroluminescence (EL) images. The method addresses key challenges in two practical areas: ...

Defect detection in industrial applications is essential for maintaining product quality and operational efficiency. However, traditional deep learning methods require centralized data collection, ...

A new technical paper titled “A Universal AI-Powered Segmentation Model for PCBA and Semiconductor” was published by researchers at Nordson Corporation. “This paper introduces a novel universal deep ...

What if manufacturing companies could pinpoint the exact cause of a defect the moment it occurs, preventing costly production delays and ensuring top-notch quality? Generative artificial intelligence ...

Automated optical inspection (AOI) is a cornerstone in semiconductor manufacturing, assembly and testing facilities, and as such, it plays a crucial role in yield management and process control.