Morningstar

Teradyne Introduces Integrated Test Solution for AI and Data Center Devices in Collaboration with Tokyo Electron

Teradyne’s UltraFLEXplus platform paired with Tokyo Electron’s probing technology delivers known good device screening for advanced 2.5D/3D packages. Teradyne, Inc. (NASDAQ: TER), a leading provider ...
EurekAlert!

Workshop tackles AI data center power, security challenges

Prasad Kandula, ORNL group leader for Grid Systems Hardware, explains medium-voltage direct current (MVDC) hardware testing capabilities during a tour of the GRID-C as part of the NGDC Workshop.
DatacenterDynamicsOpinion

Modular by necessity: Why the AI boom is making prefabricated data centers the new default

Global data center capacity grew from 42GW in 2023 to over 60GW in 2025. Goldman Sachs projects 122GW capacity by 2030. That ...
Data Center Frontier

Data Center Insights: Robert Danforth, Rehlko

Robert Danforth argues that AI infrastructure is entering an era where system performance—not simply installed power capacity ...
Nature

Integrated Circuit Testing Methodologies

The reliability and performance of integrated circuits (ICs) are ensured through a suite of complementary testing methodologies that span from low-level defect detection to system-level functional ...

Aehr Receives Follow-On Order From Major Silicon Photonics Customer for Fully Automated Wafer-Level Burn-In System for Hyperscale Data Center Optical Interconnect

Detailed price information for Aehr Test Systems (AEHR-Q) from The Globe and Mail including charting and trades.
AOL

Teradyne Introduces Integrated Test Solution for AI and Data Center Devices in Collaboration with Tokyo Electron

Teradyne, Inc. (NASDAQ: TER), a leading provider of automated test equipment and advanced robotics, today announced an integrated test cell solution supporting known good device (KGD) screening for ...